The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy for other systems in the range. the system has three interchangeable sources; the 225 kV reflection target, 180 kV transmission target and the optional 225 kV rotating target. Combined with the wide range of flat panel detectors to choose from, the ST system provides a flexible tool for quality laboratories, production facilities and research departments.
High performance image acquisition and volume processing
Straightforward inspection automation
Safety by design
Fault detection and failure analysis
Assembly inspection of complex mechanisms
Dimensional measurement of internal components
Advanced material research
Analysis of the biological structures
Digital archiving of models
Benefits & features
Superior accuracy and performance through proprietary 225 kV microfocus X-ray source
The default microfocus source is equipped with a reflection target, offering a 3 micron spot size. With the optional transmission target, you obtain an even smaller spot size and higher magnification capability. Regardless of the target of choice, the XT H 225 ST system uses an open-tube X-ray source that guarantees a lower cost-of-ownership.
Stunning images from internal structures
A small spot size and a high-resolution flat panel create sharp images. Adapt resolution to your needs: full part in coarse resolution and high resolution in a desired region of interest.
High performance processing
The core of the processing power is situated in the XT software suite that builds on Nikon Metrology’s track record of improving sample throughput and simplifying operation to take the systems out of the hands of experts and into the hands of users. XT Software also brings the fastest reconstruction of CT data currently available on a single PC. This PC is built from standard components to aid serviceability. The sample throughput can be improved further by the use of additional PCs. The complete system is also ready for any market leading CT visualization and processing software, such as VolumeGraphics.
Easy operation and automation
Users are operational with the system within a few days of training. A CT wizard guides operators through the data acquisition process.
Customizable macros automate the measurement workflow, and tight integration with industry-standard post-processing applications streamline the decision making process.
Full protective enclosure – compliant to CE and DIN 54113 radiation safety standards – requires no special badges or protective clothing. Continuous fail-to-safe monitoring during system operation. Radiation shielding is to better than 1µSv/hour external, and dual fail-safe switches/relays ensure safe operation.
Low cost of ownership
The open X-ray tube allows for local maintenance of internal tube components. The 3-wheel transportation incorporated to easily manoeuvre through double-door entries. Also no special floor treatment is to install XT H 225 ST.
Configure the system to your specific needs
Specific applications require more detailed images or higher accuracy. XT H 225 can be configured with different flat panels (Varian, Perkin Elmer) or source configuration (reflection/ transmission target) to make the system ideally suited for your needs. XT H 225ST system is an extended version to hold larger samples up to 50 kg with a diameter of about 50 cm.
As an option, the ST cabinet can have a motorized FID that allows to move the detector closer to the source. As the X-ray intensity drops with the distance, a shorter FID (Focal spot to Imager Distance) prevents that the X-ray flux decreases. This allows shorter imager exposure and results in faster scan times. Alternatively a shorter FID can give brighter images when using low energy X-rays. Both phenomena are advantageous when high magnification is not a limiting factor.
Focal spot size
Focal spot size at max power
180 kV Transmission target
1 µm up to 3 W
10 µm at 10 W
225 kV Reflection target
3 µm up to 7 W
225 µm at 225 W
225 kV Rotating target option
10 µm up to 30 W
160 µm at 450 W
Max. frame rate at 1x1 binning
Max. frame rate at 2x2 binning
2300 x 3200
Perkin Elmer 1611
4000 x 4000
Perkin Elmer 1620
2000 x 2000
Perking Elmer 1621 EHS
2000 x 2000
: Basic configuration : Alternative configuration
(Typical values - Exact values depend on system configuration)
(X) 450 mm (Y) 350 mm (Z) 725 mm (Tilt) +/- 30 (Rotate) n*360°
Max. sample weight
Cabinet dimensions (LxWxH)
2,414 mm x 1,275 mm x 2,202 mm
All systems are manufactured to IRR99
All systems are controlled by Nikon Metrology’s in-house Inspect-X software
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