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JCM-6000 Plus NeoScope - Scanning electron microscope - a powerful yet economic benchtop version from Nikon and JEOL.

nikon metrology scanning electron microscopes JEOL NeoScope JCM 6000PlusThe latest in benchtop SEM technology, the JCM-6000Plus "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification.

Main features of the JEOL JCM-6000plus

  • Automatic image formation after sample introduction within 3 minutes
  • High resolution (60,000X) and large depth of field
  • Multi-touch screen interface for intuitive operation
  • Advance automatic functions (focus, stigmation, brightness/contrast)
  • High and low vacuum modes
  • Three selectable accelerating voltages
  • Secondary electron and solid state backscattered electron detector
  • Large sample coverage (up to 70 mm diameter)
  • Options include: motor drive stage and EDS
 
Video
 
Benefits & features
 

High performance system in a compact, innovative model

nikon metrology scanning electron microscopes JEOL NeoScope multi touch screenEase of operation through the multi-touch screen or standard keyboard/mouse

Intuitive touch panel operation with new GUI

  • Well focused high resolution morphological observation
  • Secondary electron as well as Backscattered electron imaging for compositional distribution
  • Selectable accelerating voltages
  • High and Low vacuum operation
  • Full-featured Energy-dispersive X-ray Spectroscopy (EDS) with SDD technology (Optional)
  • Metrology supported
  • Imaging of tilted, rotated samples (Optional)

Compact, light, and energy saving

  • nikon metrology scanning electron microscopes JEOL NeoScope compact design

    Compact body equal to an optical microscope
  • Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
  • Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA

New capabilities for imaging

  • nikon metrology scanning electron microscopes JEOL NeoScope simultaneous displaySimultaneous display of live and retrieved images allows for comparative observation

    Secondary electron imaging and backscattered electron imaging supported at high vacuum
  • New high sensitivity solid state backscatter electron detector provides both composition and topographic imaging information
  • Dual frame imaging to facilitate comparison of live and retrieved images
  • A wide magnification range from the lowest 10x for wide area of view up to 60,000x

Enhanced low vacuum capability

  • New solid state backscattered electron detector
  • Easy observation of non conductive samples in the direct low vacuum mode
  • Only 2 minutes 30 seconds from sample loading to imaging

Simple operation

  • Easy touch panel operation
  • A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
  • Easy, dependable auto gun alignment (filament centering)

Tilt/rotation motor drive holder

nikon metrology scanning electron microscopes JEOL NeoScope tilt rotation motor drive holder

The tilt/rotation motor drive specimen holder allows the operator to tilt and rotate the sample for well focused 3D morphological observation.


Optional accessories

Energy dispersive X-ray spectrometer

  • Energy dispersive X-ray spectrometer (EDS) for elemental analysis
  • JEOL's proprietary EDS
  • Quick, reliable customer support guarantees satisfaction

*This option is retrofittable


Samples

nikon metrology scanning electron microscopes JEOL NeoScope samples boron clustersBoron Clusters

nikon metrology scanning electron microscopes JEOL NeoScope campanula pollenCampanula Pollen nikon metrology scanning electron microscopes JEOL NeoScope samples dendrites2Dendrites

nikon metrology scanning electron microscopes JEOL NeoScope samples dendritesDendrites

nikon metrology scanning electron microscopes JEOL NeoScope samples diatomsDiatoms

 

nikon metrology scanning electron microscopes JEOL NeoScope samples flyseyeFly's Eye

nikon metrology scanning electron microscopes JEOL NeoScope samples foamFoam

nikon metrology scanning electron microscopes JEOL NeoScope samples fractured concreteFractured Concrete nikon metrology scanning electron microscopes JEOL NeoScope samples instant coffeeInstant Coffee

nikon metrology scanning electron microscopes JEOL NeoScope samples instant coffee2Instant Coffee

 

nikon metrology scanning electron microscopes JEOL NeoScope samples paperPaper nikon metrology scanning electron microscopes JEOL NeoScope samples polymer stemPolymer-STEM nikon metrology scanning electron microscopes JEOL NeoScope screwScrew nikon metrology scanning electron microscopes JEOL NeoScope samples worm stemWorm-STEM nikon metrology scanning electron microscopes JEOL NeoScope samples worm stem2Worm-STEM

 
Specifications
Magnification Secondary electron image : × 10 to × 60,000 Backscattered electron image : × 10 to × 30,000 (when image size is 128 mm × 96 mm)
Imaging mode Secondary electron image, Backscattered electron image (composition, topographic or stereoscopic image)
Accelerating voltages Secondary electron image ; 5 kV, 10 kV, 15 kV (3 stages) Backscattered electron image ; 10 kV, 15 kV (2 stages)
Electron gun Small gun with cartridge filament integrating wehnelt
Bias current Auto bias (linked to accelerating voltage and filament current)
Condenser lens Two stage electromagnetic zoom condenser lens
Objective lens Electromagnetic lens
 Auto magnification correction Magnification corrected with reference to sample height (7 mm, WD56 to 53 mm, WD10)
Preset magnification  6 levels, user programmable
Specimen stage Manual control for X and Y X: 35mm, Y: 35mm
Maximum sample size Diameter 70 mm, height 50 mm
Specimen exchange  Draw-out mechanism
Image memory  One, 1,280 × 960 × 16 bits
Pixels  640 × 480, 1,280 × 960
 Image processing Pixel accumulation Image accumulation (recursible)
Automated functions Full-auto, filament adjustment, alignment, focus, stigmator, exposure
Metrology Distance between 2 points, angles
 File format BMP, TIFF, JPEG
 Computer PC (desktop PC), OS Windows®7
 Monitor 23 inch wide LCD monitor (touch panel)
 Evacuation system Fully automatic, TMP : 1, RP : 1

 

Installation requirements

Power supply Voltage : Single phase AC 100 V
(120 V, 220 V, 240 V)
 50/60 Hz, 700 VA (AC 100 V)
 840 VA (AC 120 V)
880 VA (AC 220 V)
960 VA (AC 240 V)
Fluctuation ±10 % or less, with grounding
Installation room Room temperature: 15 to 30°C
Humidity: 60% or less
Operation table: Sturdy table with a loading capacity of 100 kg or more
Weight Main console : approximately 50 kg
RP: approximately 9 kg
Power supply box : approximately 10 kg
Base unit dimensions: 325mm (Width) x 490mm (Depth) x x430mm (Height)
 
Brochures
Industrial Instruments General Catalogue
Industrial Instruments General Catalogue

en de es

Overview brochure
Overview brochure
JCM 6000 Plus Neoscope
JCM 6000 Plus Neoscope

en

 
Case studies
First teaching laboratory in Denmark with scanning electron microscopes
First teaching laboratory in Denmark with scanning electron microscopes
Five Nikon Metrology SEMs will attract hundreds more students every year with the aim of promoting physics and nanotechnology.

en

 
Nikon Metrology addresses the challenge of inspecting graphene
Nikon Metrology addresses the challenge of inspecting graphene

In recognition of the importance of graphene, the new wonder material that is ultra-light and flexible yet 200 times stronger than steel, Nikon focuses on providing inspection solutions for research of these new industrial materials and its application areas.

en

 
Scanning electron microscope supports development of next-generation ceramics
Scanning electron microscope supports development of next-generation ceramics
A JCM-6000 NeoScope SEM microscope was deployed at Morgan Advanced Materials’ Innovation Hub in the UK. The world-class facility combining technically advanced analytical equipment and development expertise to meet the challenges of its customers.

en de

 
 

Brochures

Industrial Instruments General Catalogue
Industrial Instruments General Catalogue

en de es

Overview brochure
Overview brochure
JCM 6000 Plus Neoscope
JCM 6000 Plus Neoscope

en

Case studies

First teaching laboratory in Denmark with scanning electron microscopes
First teaching laboratory in Denmark with scanning electron microscopes

en

Nikon Metrology addresses the challenge of inspecting graphene
Nikon Metrology addresses the challenge of inspecting graphene

en

Scanning electron microscope supports development of next-generation ceramics
Scanning electron microscope supports development of next-generation ceramics

en de