JCM-6000 Plus NeoScope - Scanning electron microscope - a powerful yet economic benchtop version from Nikon and JEOL.
The latest in benchtop SEM technology, the JCM-6000Plus "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification.
Main features of the JEOL JCM-6000plus
Automatic image formation after sample introduction within 3 minutes
High resolution (60,000X) and large depth of field
Multi-touch screen interface for intuitive operation
Nikon Metrology addresses the challenge of inspecting graphene
In recognition of the importance of graphene, the new wonder material that is ultra-light and flexible yet 200 times stronger than steel, Nikon focuses on providing inspection solutions for research of these new industrial materials and its application areas.
Scanning electron microscope supports development of next-generation ceramics
A JCM-6000 NeoScope SEM microscope was deployed at Morgan Advanced Materials’ Innovation Hub in the UK. The world-class facility combining technically advanced analytical equipment and development expertise to meet the challenges of its customers.