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Nikon Metrology introduces the XT V 130C

29-05-2013

A VERSATILE X-RAY INSPECTION WORKHORSE FOR ELECTRONICS QUALITY ASSURANCE FOR TODAY AND TOMORROW

Nikon Metrology announces the introduction of the XT V 130C, an upgradeable X-ray system that can be tailored to the users’ needs.  This highly flexible electronics and semiconductor inspection system provides cost-effective, future-proof entry into CT technology. 

nikon metrology xt v 130cThe system offers a 130kV/10 watt Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high-resolution imaging chain. 

Jos Jans, Exec VP Marketing, states “Many of our customers challenging applications demand a system with the functionality of Nikon Metrology’s flagship XT V 160 system, but at a lower price point.  This unit allows these customers to select the features they need to meet these applications and not pay for those features that are unnecessary.” 

Through a series of factory and field upgrades, the end-user can configure these systems with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add CT technology.  Today there is a growing demand for flexible, high-resolution, cost-effective inspection systems to meet the demands of increasingly challenging applications.  The XT V X-Ray inspection systems facilitate high-resolution analysis of assembled PCB boards, and are designed for BGA and µBGA inspection, and QFNs. 

ABOUT NIKON METROLOGY

Nikon Metrology offers the broadest range of metrology solutions for applications ranging from miniature electronics to the largest aircrafts. Nikon Metrology’s innovative measuring and precision instruments contribute to a high performance design-through-manufacturing process that allows manufacturers to deliver premium quality products in a shorter time. Further information is available on www.nikonmetrology.com .