Advanced, high-precision inspection systems with sub-micron feature recognition for X-ray inspection, defect analysis of electronic components and much more

Industry-leading system range offering micron accuracy to perform structural and dimensional analysis and measure complex geometry, all non-destructively

225kV X-ray CT for efficient, reliable and accurate inspection in production applications. All steps from R&D through production line set up and pre-series to full production line are supported.

Unique 450kV microfocus X-ray offers high power, high penetration, and high resolution for non-destructive inspection of dense components and castings

Large inspection envelope with ultra-precise manipulator design supporting multiple sources and detectors, configurable for wide-range of applications