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Semiconductor equipment

Overview

Advanced IC inspection wafer loader capable of loading 100µm thin wafers.

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NWL200

NWL200

An inspection system and analysis tool for R&D defect analysis delivering high-speed transfer and system stability.

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Optistation-3000

Optistation-3000

Compact, cost-effective solution for 300mm wafer inspection in diverse applications.

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Optistation-3100

Optistation-3100

300mm wafer inspection system featuring Nikon's renowned CFI60 optics and newly designed DUV microscope.

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Optistation-3200

Optistation-3200