Advanced IC inspection wafer loader capable of loading 100µm thin wafers.

Provides all dimensional measurements required for wafer carrier fabrication including control of deformation due to aging wafer carriers.

An inspection system and analysis tool for R&D defect analysis delivering high-speed transfer and system stability.

Compact, cost-effective solution for 300mm wafer inspection in diverse applications.

300mm wafer inspection system featuring Nikon's renowned CFI60 optics and newly designed DUV microscope.