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The JCM-7000’s highly-advanced auto functions, stage automation, and software enable easy sample imaging and elemental analysis for users of all experience levels.
Equipped with a large sample chamber, both high and low vacuum modes of operation, both secondary and backscatter electron detectors (SED & BSED), real-time 3D imaging, easy to use metrology tools and optional fully-integrated EDS. The JCM-7000 NeoScope is SMART – FLEXIBLE - POWERFUL.
What is the foreign material first observed with the optical microscope? Are there problems with the shape of the part? Was the raw material contaminated or out of specification? Quickly confirm the morphology and composition (constituent elements), which cannot be identified fully from an optical microscope alone.
Efficiency up: example - Quality Control
With the SEM it is possible to observe a compositional contrast view that cannot be seen in an optical image, so even at the same magnification, more information can be obtained. Observation and analysis can be performed with no specimen pre-treatment using the low-vacuum mode.
Holly olive leaf at 100 μm and 10 μm.Zeromag (Optional accessory)
An optical image is automatically acquired when the sample is inserted. Search for the field of view on the optical image, then zoom in on the target to automatically switch to an SEM image. Moving to the observation position is easy for quick SEM image acquisition with a minimal number of steps.
Salt rock at 500 μm and 10 μm.
Low-vacuum (LV) mode
In addition to the high-vacuum mode for the clearest SEM observation of surface morphology, the JCM-7000 is also equipped with two more LV pressure modes to allow viewing and imaging of various non-conductive specimens without pre-treatment.
Screening whilst performing observation with Live Analysis.
With Live Analysis, SEM observation and EDS analysis are no longer separate steps. The X-ray spectrum with the main constituent elements are displayed in Real Time on the observation screen.
The JCM-7000 also includes Live Map to view the spatial distribution of the elements in Real Time. Live Map increases the probability of finding the elements of interest as well as detecting unexpected elements.
SMILE VIEW Lab is a fully integrated data management software program which links the optical images, SEM SMILE VIEW Lab is a fully integrated data management software program which links the optical images, SEM images, EDS analysis results and corresponding stage coordinates for fast report generation or recall of specimen position and SEM conditions for further study.
Batch creation of reports
In the Data management screen, users can review or re-analyse data as well as generate batch reports from all the data, SEM images through analysis. The Data management screen can be opened using the Data management button or from the list of measured data. Once the data is selected, a report can be generated with just one click. Reports can be exported to PDF, Microsoft Word or PowerPoint®.
Direct magnification | x10 to 100,00 Magnification is defined by 128 mm x 96 mm |
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Display magnification | x24 to 202,168 Magnification is defined by 280 mm x 210 mm |
Mode | High-Vacuum mode: secondary electron image, Backscattered electron image (composition, topographic and shadow, 3D images) Low Vacuum mode: backscattered electron image (composition, topographic and shadow, 3D images) |
Accelerating voltage | 5 kV, 10 kV, 15 kV (3 stages) |
Electron source | Tungsten filament / Wehnelt Integrated gird |
Specimen stage | X-Y motor drive stage X: 40 mm Y: 40 mm |
Maximum specimen size | 80 mm diameter x 50 mm height |
Specimen exchange | Draw-out mechanism |
Pixels for image acquisition | 540 x 480, 1,280 x 960 2,560 x 1920, 5,120 x 3,480 |
Automatic functions | Alignment, focus, stigmator, brightness / contrast |
Measurement functions | Distance between 2 points, angles, line, width |
File format | BMP, TIFF, JPEG, PNG |
Computer | Desktop PC Windows® 10 |
Monitor | 24 inch |
Vacuum system | Full-automatic TMP: 1, RP: 1 |
Power supply |
Single phase AC 100 V (120 V, 220 V, 240 V are supported) 50 / 60 Hz |
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Voltage variation tolerance | 90 to 110 V at power supply voltage 100 V 108 to 132 V at power supply voltage 120 V 198 to 242 V at power supply voltage 220 V 216 to 250 V at power supply voltage 240 V Grounding |
Installation room | Temperature: 15 to 30°C Humidity: 30 to 60% RH (no condensation) Stray magnetic fields: 0.3 μT or less (50 / 60 Hz, sine wave) Desk: 100 kg or more, with rigidity |
Main unit dimensions | (W) 324 mm x (D) 586 mm x (H) 566 mm |
Main unit weight | 67 kg |
12701 Grand River Avenue
Brighton, MI 48116
United States
Email: sales.nm-us@nikon.com
Website: www.nikonmetrology.com
Telephone number: (810) 220-4360
12 Goodyear, Suite #105
Irvine, CA 92618
United States
Email: sales.nm-us@nikon.com
Website: www.nikonmetrology.com
Telephone number: (949) 716-4440
8113 Ridgepoint Dr.
Irving, TX 75063
United States
Email: sales.nm-us@nikon.com
Telephone number: (810) 220-4360