Latest news - 2012

17-12-2012

Nikon announces the NEXIV VMZ-R4540

Nikon Corporation (Makoto Kimura, President, Tokyo) is pleased to announce the release of the CNC Video Measuring System "NEXIV VMZ-R4540," capable of accurately measuring the dimensions and shapes of high density and multi-layered electronic components.

 
27-09-2012

Nikon introduces ECLIPSE LV-N Series industrial microscopes

Nikon Corporation (Makoto Kimura, President, Tokyo,) is pleased to announce the release of ECLIPSE LV-N series of industrial microscopes on October 1, 2012, equipped with enhanced linkage functions with Digital Sight series digital cameras for microscopy and compatible with the newly developed CFI60-2 objectives.

 
25-09-2012

Nikon introduces CFI60-2 Objective Series for industrial microscopes

Nikon Corporation (Makoto Kimura, President; Tokyo) is pleased to announce the release of the CFI60-2 objective series for industrial microscopes on October 1, 2012, which further enhances the capabilities of chromatic-aberration reduction and long working distances (*1) compared with the CFI60 objective series.

 
10-09-2012

Nikon Metrology introduces premium portable scanning solution featuring new MCAx articulated arm and ModelMaker MMDx/MMCx scanners

Nikon Metrology introduces the MCAx Manual Coordinate Measuring Arm - a precise, reliable and easy-to-use portable 7-axis measuring arm. It is the perfect partner for the ModelMaker MMDx/MMCx digital handheld laser scanners and Focus 10 Handheld scanning and inspection software. This total solution’s accuracy, capability and portability make it feel perfectly at home in the metrology lab, on the shop floor and in-the-field. The MCAx arm can be equipped with a wide range of probing systems for laser scanning, touch-trigger measurements and continuous scanning. The new 7-axis MCAx range of articulated arms is available with a measurement volume ranging from 2.0 and 4.5 meter diameter.

 
07-05-2012

Nikon Metrology announces new metrology CT system

Nikon Metrology combines 50 years’ experience of Coordinate Measuring Machine (CMM) metrology with 25 years’ experience of X-ray Computed Tomography (CT) to develop a new “absolute accuracy” Metrology CTsystem. MCT225 provides Metrology CTfor a wide range of sample sizes and material densities with 9+ L/50 µm accuracy in accordance with the VDI/VDE 2630 guideline. All internal and external geometry is measured efficiently in a single non-destructive process. A full 3D visualization of the sample volume additionally provides valuable insights into part deformations and internal structural integrity.

 
07-05-2012

Nikon Metrology extends its multi-sensor support to include Renishaw's REVO probe

Nikon Metrology CMMs leverage the productivity gains offered by Renishaw’s five-axis REVO probe system. REVO is a dynamic probe system designed to maximize CMM throughput by providing improved accuracy, faster measurement and greater flexibility. With an optimum stiffness-to-weight advantage Nikon Metrology’s ceramic CMMs take full advantage of the performance enhancements offered by REVO for automotive powertrain and aero engine applications.

 
29-02-2012

Nikon LC15Dx scanner closes the gap with tactile probe accuracy

For over a decade, Nikon Metrology pioneered laser scanning and gradually sharpened the capabilities of this non-contact measuring technology. Nikon’s superior optics combined with innovative 3D laser scanning technology resulted in this new, groundbreaking Nikon scanner. The LC15Dx digital laser scanner is a new milestone, as it brings laser scanning in the accuracy range of tactile inspection.LC15Dx is a viable alternative to a tactile probe for an increasing number of high precision CMM applications; including molds, small turbine blades, medical devices and other complex geometry.