XC65Dx Laser Scanner - The ultimate 3-in-1 Cross Scanner for 3D Feature Inspection

Thanks to its patented, triple-laser configuration, the XC65Dx cross scanner captures comprehensive information about complex 3D geometric features and freeform surfaces in a single scan. It can be seamlessly retrofitted to most leading makes of coordinate measuring machine (CMM). Productivity is greatly improved by reducing time spent on programming scan paths, as well as by cutting actual measurement time. Non-contact inspection by laser scanning is perfectly suited to quality control when dealing with soft and fragile surfaces that cannot be measured by tactile inspection.

 

THE XC65DX-LS

The XC65Dx-LS scanner variant of the XC65Dx offers a longer stand-off distance which offers distinct advantages. By capturing geometry up to a distance of 170mm (7.1”), the scanner gains optimum access to difficult-to-reach features on body-in-white, for example, or is able to scan over clamps that hold components in position. For these reasons, the XC65Dx-LS scanner is frequently used on horizontal-arm CMMs in the automotive industry.

 

 

View specifications


Product overview

From inspecting an individual part such as a car door to a fully assembled vehicle, the XC65Dx is the ideal CMM scanner for fast, precise measurement of geometric features and complex freeform surfaces. Part programming is easy and the three-laser configuration enables all details of the part to be captured efficiently and accurately. The user quickly gains more insight regarding the dimensional quality of the parts.

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Efficient and accurate 3D inspection
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High accuracy feature measurements
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Increased speed


Benefits & features


nikon metrology 3dmetrology xc65dx faster inspectionFaster inspection by eliminating scanner re-orientation

Offering patented multi-laser capability, the XC65Dx or ‘Cross Scanner’ captures all 3D details of geometrical features and complex surfaces in a single scan pass. With laser beams being projected from 3 sides, the XC65Dx provides maximum coverage so that there is no need to take multiple scans using different scanner orientations. This avoids repeated, time-consuming re-orientations of the probe head, saving significant teaching effort and scanning execution time.

 



nikon metrology 3dmetrology xc65dx unique laser intensity adaptationUnique laser intensity adaptation

To effectively scan different surfaces with varying color or high reflectivity, the XC65Dx laser scanner uses Nikon Metrology’s third-generation Enhanced Sensor Performance (ESP3). The proprietary technology not only provides automatic, real-time adjustment of sensor settings between successive laser stripes, but also for each individual point along the laser stripe. As a result, users can scan a large variety of materials without the need for time consuming tuning of the scanner parameters or special preparation of the parts.

 



nikon metrology 3dmetrology xc65dx easy macro based programmingEasy macro-based programming

The unique, three-laser concept not only speeds operation but also reduces the time spent on preparing for measurement. As geometric features or freeform surfaces can be captured in a single pass instead of multiple scans, programming of the scan paths is drastically simplified. Whereas preparing measurement plans for traditional metrology tools can consume valuable operator and CMM time, this can be done in a fraction of the time with the XC65Dx scanner.

 



nikon-metrology-3dmetrology-xc65dx-seamless-retrofit

Seamless retrofit with most leading CMM brands

Nikon Metrology XC65Dx (LS) scanners can be retrofitted on a wide range of CMM brands to boost inspection productivity of existing CMM installations.


 

Specifications

 XC65DxXC65Dx-LS 
Probing error(MPEp)1 12 µm (0.00047") 15 μm (0.00060")
Ball bar length (MPEE)2 4+L/350(µm)
(0.00016+L/350) (")
4+L/350(µm)
(0.00016+L/350) (")
Multi-stylus test (MPEal)3 9 μm (0.00035”) 9 μm (0.00035”)
ISO Probing form error4 25 µm (0.00098”) 35 µm (0.00138”)
ISO Probing size error all5 45 µm (0.00177”) 80 µm (0.00315”)
ISO Probing dispersion value6 48 µm (0.00189”) 60 µm (0.00236”)
ISO Cone angle7 115° 125°
Scanning speed Cross Scanner mode: 3 x 25,000 pts/s
Line scanner mode: 1 x 75,000 pts/s
75 lines/s
Cross Scanner mode: 3 x 25,000 pts/s
Line scanner mode: 1 x 75,000 pts/s
75 lines/s
Width of view 3x65 mm (3x2.56”) 3x65 mm (3x2.56”)
Depth of view 3x65 mm (3x2.56”) 3x65 mm (3x2.56”)
Stand-off distance (approx.) 75 mm (2.95”) 170 mm (6.69”)
Dimensions 155x86x142 mm (6.1x3.4x5.6”) 155x86x142 mm (6.1x3.4x5.6”)
Weight (approx.) 440 g (0.97 lbs) 480 g (1.06 lbs)
Enhanced Scanner Performance ESP3 ESP3
Laser safety Class 2 Class 2
Probe head compatibility PH10M, PH10MQ, CW43, PHS PH10M, PH10MQ, CW43, PHS

 

All accuracy specifications valid for a CMM with an accuracy of 2µm + L/350 or better using manufacturer supplied test sphere
1Nikon Metrology test comparable to EN/ISO 10360-2 MPEP using 1 sigma sphere fit.
2Nikon Metrology test comparable to EN/ISO 10360-2 MPEE
3Nikon Metrology test comparable to EN/ISO 10360-5 MPEAL Accuracy specifications according ISO 10360-8:2013:
4PForm.Sph.1x25:Tr:ODS,MPE : Maximum probing form error using 25 representative points in translatory scanning mode
5PSize.Sph.All:Tr:ODS,MPE : Maximum probing size error All using all measured points in translatory scanning mode
6PForm.Sph.D95%:Tr:ODS,MPL : Maximum probing dispersion value using 95% of the measured points in translatory scanning mode
7Cone angle : Region of sphere on which the measured points are selected


 

 

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