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Nikon Metrology NV | Europe

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Computed Tomography

Overview

The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction.

XT H 225

XT H 225

The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and small to large sample sizes.

XT H 225 ST

XT H 225 ST

XT H 320 for X-ray and CT inspection of larger samples.

XT H 320

XT H 320

Unique XT H 450 micro-focus X-ray and CT system for turbine blade and casting inspection.

XT H 450

XT H 450