XT H 450 - Unique micro-focus X-ray and CT system for turbine blade and casting inspection
The XT H 450 system offers the necessary source power to penetrate through high density parts and generate a scatter-free CT volume with micron accuracy. The system is available with a flat panel or a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays. This linear detector realizes stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. 450 kV and the CLA are ideal for the inspection of small to medium metal alloy turbine blades and casted parts.
Proprietary 450 kV microfocus X-ray source
Run highly accurate inspection on dense turbine blades
Easy system operation and low cost-of-ownership
Stunning 3D images without scattering provide critical insights
High performance image acquisition and volume processing
Straightforward inspection automation
Turbine blade inspection
Micro-CT inspection of dense materials
Benefits & features
450 kV X-ray source provides power to inspect metal parts
At the core of this powerful equipment is a 450 kV/450 W micro-focus source, offering sufficient X-ray power to penetrate dense specimens, such as turbine blades and casted engine parts. Through automated inspection and high-speed CT reconstruction, blade manufacturers can run detailed CT inspection of turbine blades (e.g. wall thickness) to optimize the fuel economy of jet engines.
Superior accuracy through proprietary microfocus X-ray source
The proprietary 450 kV/450 W source is the only micro-focus X-ray source at this energy, and delivers 25 micron repeatability and accuracy! As this micro-focus spot size is considerably smaller than existing mini-focus sources, the level of detail that it captures is beyond comparison. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts
Curved Linear Array (CLA) detector for optimized X-rays collection
When X-rays hit an object, they are absorbed but also scattered, an undesired phenomena that aggravates with the density of the part. Scatter coming from all points of the part reduces image contrast sensitivity, as is visible on flat panel images. The newly developed detector featuring a Curved Linear Array (CLA) of diodes optimizes the collection of the X-rays that travel through the part without capturing the scattered X-rays. By avoiding image pollution and associated contrast reduction, CLA realizes stunning image sharpness and contrast.
The linear array of diodes is curved to further enhance image quality by keeping the X-ray path length to diode receptors constant compared to straight arrays. This allows longer crystals to be used to enhance the X-ray sensitivity and hence boost the signal-to-noise ratio. The XT H 450 manages X-ray data acquisition to generate a 2D slice of highest possible accuracy and in order to obtain a 3D volume, various slices are combined.
With a maximum specimen diameter of 600 mm and 500 mm length, XT H 450 is a flexible X-ray/CT system that deals with multiple small blades at high magnification, and also large blades and large castings. In a production environment, the shop floor friendly system runs automatic data acquisition and inspection based on blade type, generating pass/fail status for each inspected part. When taking radiographs of turbine blades, raw images and specific information items, such as blade profiles and inner and outer wall thicknesses, are stored in the database for traceability and further analysis.
Full protective enclosure and continuous fail-to-safe monitoring
XT H systems have a full protective enclosure – compliant to CE and DIN 54113 radiation safety standards and have continuous fail-to-safe monitoring during system operation.
Operation requires no special badges or protective clothing.
Focal spot size
Focal spot size at max power
450 kV Reflection target
80 µm up to 50 W
320 µm at 450 W
450 kV High brilliance source
80 µm up to 100 W
113 µm at 450 W
Max. frame rate at 1x1 binning
Max. frame rate at 2x2 binning
Perkin Elmer 1611
4000 x 4000
Perkin Elmer 1620
2000 x 2000
Perkin Elmer 1621 EHS
2000 x 2000
Nikon Metrology CLDA
Combination PE162x & CLDA
Configuration with both Flat panel and Curved Linear Diode Array detector
(Typical values - Exact values depend on system configuration)
(X) 400 mm (Y) 600 mm (Z) 600 mm (Rotate) n*360
Max. sample weight
Cabinet dimensions (LxWxH)
3613 mm x 1828 mm x 2249 mm
All systems are manufactured to IRR99
All systems are controlled by Nikon Metrology’s in-house Inspect-X software
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