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XT H 225 ST – Industrial CT scanning

nikon metrology xray ct computed tomography XTH225STThe XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy for other systems in the range. the system has three interchangeable sources; the 225 kV reflection target, 180 kV transmission target and the optional 225 kV rotating target. Combined with the wide range of flat panel detectors to choose from, the ST system provides a flexible tool for quality laboratories, production facilities and research departments.

Benefits:

  • Proprietary 225 kV microfocus X-ray source with 3 µm focal spot size
  • Easy system operation
  • Stunning images providing maximum insight
  • High performance image acquisition and volume processing
  • Straightforward inspection automation
  • Safety by design
  • Low cost-of-ownership

Applications

  • Fault detection and failure analysis
  • Assembly inspection of complex mechanisms
  • Dimensional measurement of internal components
  • Part-to-CAD comparison
  • Advanced material research
  • Analysis of the biological structures
  • Digital archiving of models
 
Benefits & features
 

nikon metrology xray ct computed tomography XTH225ST superior accuracySuperior accuracy and performance through proprietary 225 kV microfocus X-ray source

The default microfocus source is equipped with a reflection target, offering a 3 micron spot size. With the optional transmission target, you obtain an even smaller spot size and higher magnification capability. Regardless of the target of choice, the XT H 225 ST system uses an open-tube X-ray source that guarantees a lower cost-of-ownership.


Stunning images from internal structures

A small spot size and a high-resolution flat panel create sharp images.  Adapt resolution to your needs: full part in coarse resolution and high resolution in a desired region of interest.

nikon metrology xray ct computed tomography XTH225ST materials


nikon metrology xray ct computed tomography XTH225ST high performance processingHigh performance processing

The core of the processing power is situated in the XT software suite that builds on Nikon Metrology’s track record of improving sample throughput and simplifying operation to take the systems out of the hands of experts and into the hands of users. XT Software also brings the fastest reconstruction of CT data currently available on a single PC. This PC is built from standard components to aid serviceability. The sample throughput can be improved further by the use of additional PCs. The complete system is also ready for any market leading CT visualization and processing software, such as VolumeGraphics.


nikon metrology xray ct computed tomography XTH225ST easy operationEasy operation and automation

Users are operational with the system within a few days of training. A CT wizard guides operators through the data acquisition process.

Customizable macros automate the measurement workflow, and tight integration with industry-standard post-processing applications streamline the decision making process.


Safety first

Full protective enclosure – compliant to CE and DIN 54113 radiation safety standards – requires no special badges or protective clothing. Continuous fail-to-safe monitoring during system operation. Radiation shielding is to better than 1µSv/hour external, and dual fail-safe switches/relays ensure safe operation.


Low cost of ownership

The open X-ray tube allows for local maintenance of internal tube components. The 3-wheel transportation incorporated to easily manoeuvre through double-door entries. Also no special floor treatment is to install XT H 225 ST.


nikon metrology xray ct computed tomography XTH225STConfigure the system to your specific needs

Specific applications require more detailed images or higher accuracy. XT H 225 can be configured with different flat panels (Varian, Perkin Elmer) or source configuration (reflection/ transmission target) to make the system ideally suited for your needs.
XT H 225ST system is an extended version to hold larger samples up to 50 kg with a diameter of about 50 cm.


Motorized FID

As an option, the ST cabinet can have a motorized FID that allows to move the detector closer to the source. As the X-ray intensity drops with the distance, a shorter FID (Focal spot to Imager Distance) prevents that the X-ray flux decreases. This allows shorter imager exposure and results in faster scan times. Alternatively a shorter FID can give brighter images when using low energy X-rays. Both phenomena are advantageous when high magnification is not a limiting factor.

 
Specifications
Microfocus sourceMax. kVMax. powerFocal spot sizeFocal spot size
 at max power
180 kV Transmission target alternative configuration 180 kV 20 W 1 µm up to 3 W 10 µm at 10 W
225 kV Reflection target basic configuration 225 kV 225 W 3 µm up to 7 W 225 µm at 225 W
225 kV Rotating target option alternative configuration 225 kV 450 W 10 µm up to 30 W 160 µm at 450 W

 

Detectors# BitsActive pixelsPixel SizeMax. frame rate
 at 1x1 binning
Max. frame rate
 at 2x2 binning
Varian 4030 alternative configuration 14-bit 2300 x 3200 127 µm 3 fps  7 fps
Perkin Elmer 1611 alternative configuration 16-bit 4000 x 4000 100 µm 3.75 fps 7.5 fps
Perkin Elmer 1620  alternative configuration 16-bit 2000 x 2000 200 µm 3.75 fps 7.5 fps
Perking Elmer 1621 EHS alternative configuration 16-bit 2000 x 2000 200 µm 15 fps 30 fps

 
 basic configuration:  Basic configuration
  alternative configuration :  Alternative configuration

Manipulator 
# Axes 5

Axes travel

(Typical values - Exact values depend on system configuration)

(X) 450 mm
(Y) 350 mm
(Z) 725 mm
(Tilt) +/- 30
(Rotate) n*360°
Max. sample weight 50 kg

 

General 
Cabinet dimensions (LxWxH) 2,414 mm x 1,275 mm x 2,202 mm
Weight 4,200 kg
Safety All systems are manufactured to IRR99
Control software  All systems are controlled by Nikon Metrology’s in-house Inspect-X software 

 

 

 
Brochures
Overview brochure
Overview brochure
XT H Series
XT H Series

en fr de

 
Case studies
Comprehensive inspection of impellers with CT
Comprehensive inspection of impellers with CT

Being subject to excessive temperatures and pressures, the smallest variations or defects can enormously effect the performance of automotive components such as impellers in turbochargers. This makes 100% inspection necessary not only for dimensions but also for structural and build quality.

en

 
Computed Tomography accelerates product time-to-market by NDT analysis
Computed Tomography accelerates product time-to-market by NDT analysis

Advanced filters are used in many industries such as automotive, medical, oil & air filtration. As filters are often complex assemblies, advanced inspection techniques help to provide a better insight in structural or operational deficiencies such as internal voids, sealing problems or filter tears.

en

 
Industrial CT inspection of implants and prostheses
Industrial CT inspection of implants and prostheses

Many sizes of implants produced today and their dimensions are critical for use in the human body. New manufacturing technologies need careful inspection to guarantee a long service life. CT provides a detailed inner and outer 3D image that verifies the correct positioning, shapes and structural.

en

 
Mindarika adopts microfocus CT to inspect automotive components
Mindarika adopts microfocus CT to inspect automotive components
 Mindarika designs and manufactures electrical switches for automotive OEMs. Requiring a non-destructive inspection method, the XT H 225 ST was installed to introduce non-destructive testing for an increased insight and high levels of quality.

en

 
Patient-specific implants made affordable
Patient-specific implants made affordable

Ortho Baltic, a manufacturer of patient-specific medical implants recently invested in additive manufacturing and CT inspection technology. It is vital for such components to be of outstanding quality, therefore an assured quality control system is integral to the company’s success.

en

 
X-Ray Computed Tomography expands horizons of anthropology at Duke university
X-Ray Computed Tomography expands horizons of anthropology at Duke university
At Duke University, X-ray micro CT equipment is used to research anthropology studying the origin of mankind. But also biotech firms, electronic materials companies, government research organizations, and others have interest in using CT.

en

 
X-ray inspection shifts a gear higher at SGC - SwitchGear Company!
X-ray inspection shifts a gear higher at SGC - SwitchGear Company!

SwitchGear Company uses a 225 kV Microfocus CT system to non-destructively inspect the quality of various components to accelerate product development and maintain high quality standards for incoming components from suppliers.

en

 
 
Industrial applications
 
 

Brochures

Overview brochure
Overview brochure
XT H Series
XT H Series

en fr de

Case studies

Comprehensive inspection of impellers with CT
Comprehensive inspection of impellers with CT

en

Computed Tomography accelerates product time-to-market by NDT analysis
Computed Tomography accelerates product time-to-market by NDT analysis

en

Industrial CT inspection of implants and prostheses
Industrial CT inspection of implants and prostheses

en

Mindarika adopts microfocus CT to inspect automotive components
Mindarika adopts microfocus CT to inspect automotive components

en

Patient-specific implants made affordable
Patient-specific implants made affordable

en

X-Ray Computed Tomography expands horizons of anthropology at Duke university
X-Ray Computed Tomography expands horizons of anthropology at Duke university

en

X-ray inspection shifts a gear higher at SGC - SwitchGear Company!
X-ray inspection shifts a gear higher at SGC - SwitchGear Company!

en