Improved work efficiency
What is the foreign material first observed with the optical microscope? Are there problems with the shape of the part? Was the raw material contaminated or out of specification? Quickly confirm the morphology and composition (constituent elements), which cannot be identified fully from an optical microscope alone.
Efficiency up: example - Quality Control
With the SEM it is possible to observe a compositional contrast view that cannot be seen in an optical image, so even at the same magnification, more information can be obtained. Observation and analysis can be performed with no specimen pre-treatment using the low-vacuum mode.
Seamless transition from Optical to SEM imaging
Holly olive leaf at 100 μm and 10 μm.Zeromag (Optional accessory)
An optical image is automatically acquired when the sample is inserted. Search for the field of view on the optical image, then zoom in on the target to automatically switch to an SEM image. Moving to the observation position is easy for quick SEM image acquisition with a minimal number of steps.
Salt rock at 500 μm and 10 μm.
Low-vacuum (LV) mode
In addition to the high-vacuum mode for the clearest SEM observation of surface morphology, the JCM-7000 is also equipped with two more LV pressure modes to allow viewing and imaging of various non-conductive specimens without pre-treatment.
Screening whilst performing observation with Live Analysis.
Seamless transition from SEM imaging to EDS Analysis
With Live Analysis, SEM observation and EDS analysis are no longer separate steps. The X-ray spectrum with the main constituent elements are displayed in Real Time on the observation screen.
The JCM-7000 also includes Live Map to view the spatial distribution of the elements in Real Time. Live Map increases the probability of finding the elements of interest as well as detecting unexpected elements.
Simple report creation and data management
SMILE VIEW Lab is a fully integrated data management software program which links the optical images, SEM SMILE VIEW Lab is a fully integrated data management software program which links the optical images, SEM images, EDS analysis results and corresponding stage coordinates for fast report generation or recall of specimen position and SEM conditions for further study.
Batch creation of reports
In the Data management screen, users can review or re-analyse data as well as generate batch reports from all the data, SEM images through analysis. The Data management screen can be opened using the Data management button or from the list of measured data. Once the data is selected, a report can be generated with just one click. Reports can be exported to PDF, Microsoft Word or PowerPoint®.