The LV100ND series includes manual (LV100ND) and motorised (LV100NDA) microscope systems with both episcopic and diascopic illumination capability for materials inspection in research and development activities.
Example applications include, semiconductor devices, packaging, Flat panel display (FPD), electronic components, innovative materials, and precision molds by using dedicated episcopic and diascopic contrast techniques as required.
The LV100ND and LV100NDA capabilities
The universal microscope concept allows the widest range of complementary optical contrast techniques, and varying sample dimension all together on one microscope stand thanks to the modular component program.
Superb optics provide excellent images to both eyepieces and Nikon Metrology’s digital imaging cameras and analysis software.
Benefits & features
Nikon Metrology's world-class CFI60-2 optical series all provide clear, high-contrast, brightfield and darkfield images as well as polarization (POL) and interference (DIC, double beam interferometry) techniques.
- The LV100ND and LV100NDA microscopes are optimised for advanced digital image capture and analysis studies.
- Flatter and sharper images provide the best possible report results.
- The lead-free optical system was a result of Nikon’s CSR philosophy where applied to manufacturing activities.
- Low magnification metallurgical objectives (1x and 2.5x) allow ultra wide field images to be captured.
- Top quality objective lens options with apochromatic correction at higher magnifications (50x, 100x) are available.
Phase Fresnel lens
Phase Fresnel lens elements enable a long working distance with excellent colour aberration correction. Conventional lenses rely only upon the refraction of light to form an image. As the strength of refraction varies according to colour (wavelength), the image is formed starting with the light closest to the lens in the order blue, green and red. In contrast, a Phase Fresnel lens uses the diffraction of light to form an image starting with the light closest to the lens, this time red, green and blue, yielding a result opposite to that of refraction. Combining these two types of lenses cancels out the chromatic aberration of each and results in an image with greatly reduced colour distortion and excellent quality.
Long working distance performance as standard
The LV series microscopes are convenient for the operator to use thanks to the standard long working distance objective lenses.
By using exceptionally short distances between normal lens elements and Phase Fresnel lens elements a longer working distance over lenses of a conventional design is realised.
Universal concept: Optical image contrast methods
- A wide range of optical contrast methods is provided for the observer.
- In reflected light mode, brightfield, darkfield, polarising, differential interference (DIC), epi-fluorescence and two-beam interferometry are all possible.
- In transmitted light mode, brightfield, darkfield, polarizing, differential interference (DIC) and phase contrast are also possible.
Variety of illuminators and light sources
Three episocopic illuminators are available for universal imaging and motorization functions.
The LV-UEPI2A motorized universal episcopic illuminator is equipped with advanced optics suitable for a wide variety of observation methods—brightfield, darkfield, DIC, epifluorescence, and double-beam interferometry. It allows the operator to concentrate on the observation by automatically maintaining optical illumination conditions.
When configured with the LV-ECON E control unit, this illuminator can be addressed by the unit, and/or a connected PC.
Modular component concept
From the lamphouse to the eyepiece every component option maybe chosen to most closely match a user’s application requirement.
For example, light sources (EPI and/or DIA, Fluorescence), microscope stands, XY stages, objective lenses, nosepieces, optical heads, eyepieces, camera mounts, digital cameras, optical filters, and contrast technique components.
Ergonomic design concept
Ergonomic advantages are realised from the design of function controls and operator posture with all Eclipse microscopes. The optimal position of the operator’s controls and a variable angle observer tube allows for fatigue-free work .
Nikon Metrology’s eye tubes deliver the image the right way up and the right way around. This is not generally the case with biological microscope tubes, but an observer viewing raw material and industrial components do need to have a real and correct view of the sample.
The LV100NDA stand allows full detection of information and control of objective lenses, light intensity, aperture stop, and observation method (brightfield / darkfield / fluorescence) via Nikon imaging software tools.
This enables an efficient, effective, and repeatable workflow.
Intelligent nosepiece communication
The LV100ND stand allows information about the objective lens in use to be detected and reported when using the Intelligent Nosepiece LV-NU5I with the Nosepiece Adaptor LV-INAD. The information is automatically corrected with the appropriate calibration data when changing the objective lens.
Digital Sight cameras for Image Analysis
Nikon Digital Sight cameras work with the NIS-Elements software suite.
The full range of Nikon digital cameras can be used to capture images of a sample and deliver them into the image processing software of the NIS-Elements suite, together with microscope data on the objective lens used, magnification changer setting and light intensity.
NIS-Elements software suite
NIS-Elements is a fully featured imaging software solution for microscopy.
Images may be joined into a larger single area view file.Despite limited sample dimensions, high resolution images can be extended into a compound file extending along a feature such as a fracture crack or heat affected zone, without being limited to the aspect ratio of the camera chip.
Grain size analysis (option)
Grains in one- and two-phase material samples may be detected and measured according to JIS G0551, ASTM E112-13, E1382-97, ISO643 , and GB/T 6394 standards.
Routine quality standard operations may be performed with dedicated and capable software functions.
Cast iron analysis (option)
Graphite content or graphite-corrected samples can be detected, measured and classified according to JIS G5502, ASTM A247-06, and ISO945-1 standards.
Routine quality standard operations may be performed efficiently with dedicated and capable software functions.
NIS-Elements: Nikon Imaging Software
NIS Elements software manages Nikon Metrology’s Digital Sight cameras to capture the best images for processing. It organises images, processes them logically and in a smooth workflow. Fast, powerful imaging tools are enabled, such as a mosaic creation from many images, for example following a long micro-crack inside a sample on the surface to start / finish.
Another useful tool is Extended Depth of Focus (EDF), where an enhanced depth of focus view is provided as an image stack, or a simple, single image is formed only from points of sharp focus. The upgradable NIS-Elements concept balances a user’s needs with the software modules and capabilities available.
Nikon Metrology Strategic Partners
Nikon Metrology’s supplier partnership program offers an exceptionally high degree of communication and solution development. It delivers a valuable combination of in-house products together with those from selected third-party solution providers
- Eclipse LV100ND and LV100NDA (Europe)
- The Image Source. A wide range of digital camera solutions for routine applications
- Märzhäuser & Prior. Solutions with motorised stages for process automation
- Inspectis. A macro view of large areas such as for weld inspection alongside the microscopic capability of the stereo microscopes
|Base unit:||Maximum sample height: 38 mm (when used with LVNU5AI U5AI nosepiece and LV-S32 3x2 stage / LV-S64 6x4 stage) |
* 73 mm when used with one column riser 12V50W internal power source for dimmer, coarse and fine adjustment knobs
Left: coarse and fine adjustment / Right: fine adjustment, 40 mm stroke Coarse adjustment: 14 mm/turn (with torque adjustment, refocusing mechanism)
Fine adjustment: 0.1 mm/turn (1 μm/graduation) Stage mounting hole intervals: 70 x 94 (fixed by 4-M4 screw)
|Nosepieces:||C-N6 ESD Sextuple Nosepiece ESD LV-NU5 Universal Quintuple Nosepiece ESD LV-NBD5 BD Quintuple Nosepiece ESD LV-NU5I Intelligent Universal Quintuple Nosepiece ESD|
|Episcopic Illuminator:||LV-UEPI-N |
LV-LH50PC 12V50W Precentered Lamphouse Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable) Accepts ø 25 mm filter (NCB11, ND16, ND4), polarizer/analyzer, plate, excitation light balancer; equipped with noise terminator
LV-LH50PC 12V50W Precentered Lamphouse HG precentered fiber illuminator: C-HGFIE (with light adjustment) *option Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable), automated optical element switching feature matched to brightfield, darkfield, and epi-fluorescence switch Accepts ø 25 mm filter (NCB11, ND16, ND4), polarizer/analyzer, λ plate, excitation light balancer; equipped with noise terminator
|Diascopic Illuminator||LV-LH50PC 12V50W Precentered Lamphouse (Fly Eye optical system) |
Internal aperture. field diaphragm, filter (ND8. NCB11); transmitted/reflected selector switch; 12V100W also available (option)
|Eyepiece tubes:||LV-T13 trinocular eyepiece tube ESD (Erected image. FOV: 22/25), LV-TT2 TT2 tilting trinocular eyepiece (Erected image. FOV: 22/25). |
P-TB Binocular Tube (Inverted image, FOV: 22), P-TT2 Trinocular Tube (Inverted image. FOV: 22)
|Stages:||LV-S32 3x2 stage (Stroke: 75 x 50 mm with glass plate) ESD compatible |
LV-S64 6x4 stage (Stroke: 150 x 100 mm with glass plate) ESD compatible
LV-S6 6x6 stage (Stroke: 150 x 150 mm) ESD compatible
|Eyepieces:||CFI eyepiece series|
|Objective lenses:||Industrial Microscope CFI60-2/CFI60 optical system Objective lens series: Combinations in accordance with the observation method|
|ESD performance:||1000 to 10V, within 0.2 sec. (excluding certain accessories)|