Building on Nikon’s Industry leading Double Beam Interferometry objectives, Nikon Metrology has launched a series of White Light Interferometry (WLI) Systems, which will set a new the standard in 2D and 3D surface profiling.
Nikon’s new Focus Variation with White Light Interferometry (FVWLI) moves the technique in to new ground. With effective height resolution of 15 pm (picometer), more precise and accurate 3D surface height measurements are now achievable.
Integrating Nikon’s existing industrial research grade microscope range with the latest WLI technology, Nikon is able to combine a WLI system, with standard optical techniques such as Brightfield, Darkfield, polarized light, DIC and Epi-fluorescence, making the BW series, truly versatile imaging systems.
The BW series offers a variety of options including: a choice of high speed and high resolution cameras; a range of Nikon DI Objectives; piezo objectives and nosepieces; and manual or motorized scanning stages, all of which add up to numerous systems suitable for all customer’s needs and budgets.
Applications for the BW series White Light Interferometer include surface and roughness analysis of: glass; ceramic; silicon wafer; ball bearings; image sensors; thin films; graphene; molds; rubber; metals; plastics.
Graphene layer height measurement
Image courtesy of Dr. Peter Blake, Graphene Industries Ltd