Metris became a member of the Nikon group
International German French USA


CMM scanners

Handheld 3D scanners

Robotized scanning

Point cloud software

Coordinate measuring machines

Articulated arms

CMM software

K-Series Optical CMM

Large volume metrology

Large volume metrology, tracking & positioning

X-ray and CT inspection

Industrial X-ray and CT

XT H 225 industrial CT scanning
XT H 225/320 LC industrial CT system
XT H 450 LC for blade inspection
Special purpose-built systems and configurations
CT applications
CT processing performance

Electronics inspection

X-ray and CT concepts

X-ray and CT inspection software

X-ray and CT contract inspection

Video measuring systems

Measuring microscopes

Industrial microscopes

Electron microscopes

Optical comparators

Autocollimators

Digital height gages

Vision measuring instruments software

Semiconductor systems

Motion measurement & Robotics

 Back      
Products > X-ray and CT inspection > Industrial X-ray and CT > CT processing performance

Superior processing performance for ultra-fast CT reconstruction


Real time X-ray inspection

  • Interactive joystick control for intuitive part positioning
  • Ultra-fast acquisition of X-ray scans
  • Integrated display and analysis tools
  • Capability to measure on screen
  • Support of annotation and dimensional data
  • Programmable macros for automated repetition

Fast CT reconstruction
  • Precise reconstruction into 3D volume dataset  using off-the-shelf PC hardware
  • Quick full part reconstruction for general analysis
  • Detailed reconstruction for drilling into specific regions of interest
  • On-the spot creation of CT slices
 
Offline CT analysis

  • CT data ready for export to 3rd party software package
  • CAD-comparison of external and internal surfaces
  • Geometric shape fitting in internal 3D features
  • Off-line analysis on dedicated visualization station
  • Movie capture of complex internal structure




Industrial Processing Performance
Part to CAD analysis

Industrial Processing Performance

Dimensioning



Industrial Processing Performance
Full part with coarse resolution, high resolution in specific region of interest  


Industrial Processing Performance
Geometry fitting

Drill wall tickness analysis

Wall Thickness Analysis

Product brochures


XT H 225 - Industrial inspection - Industrial X-ray and Computed Tomography



Latest news

19/07/2010
Nikon Metrology and Verisurf team up to increase manufacturing efficiency

16/07/2010
Nikon Confocal NEXIV VMZ-K6555 Provides New Measurement Possibilities for Demanding Applications

15/07/2010
Nikon Metrology announces availability of Optelics H1200 real color confocal microscope

© 2010 Nikon Metrology NV
Contact   Site Map   Privacy   Terms of use