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Metris became a member of the Nikon group
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Brighton, Michigan, September 21 – At Quality Expo 2009 (Sept 22-24), Metris will have the broadest range of innovative optical metrology solutions on display. Exhibit highlights include all-digital LC60D laser scanning on MCA measuring arm offering increased productivity and ease of use, and optimized path scanning on Metris CMM that reduces inspection cycle times. For metrology teams using fixed and portable CMMs of different make, CMM-Manager serves as a single straightforward software tool that boosts efficiency on all measuring hardware.
Metris looks forward to demonstrate numerous technology innovations at Quality Expo, a leading US tradeshow focusing on metrology and inspection applications. Tightly integrated laser-based solutions accelerate inspection and meet the toughest challenges in the small, medium and large scale metrology segments.
To illustrate handheld scanning economics and ergonomics, Metris introduces dual use of the next-generation digital LC60D laser scanner, both integrated on the MCA articulated measuring arm for handheld scanning and on CMM for automated inspection tasks.
LC60D offers superior optical and digital technology, translating into higher accuracy and faster data acquisition as well as automatic point-per-point laser intensity adaptation.
At Quality Expo, Metris will also show the integration of Metris scanners into Polyworks point cloud analysis software using the Focus Handheld application programming interface (API). This solution enables design and manufacturing professionals to take full advantage of using top-class Metris scanners in combination with this leading point cloud analysis software to tackle inspection or reverse engineering tasks. Thanks to the Focus Handheld API, it becomes very straightforward for all 3rd-party software vendors to integrate Metris 3D laser scanning.
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Digital LC60D and XC65D laser scanners capture the most complex part surfaces and geometric features at record throughput. And with Camio’s optimized scan path implementation CMM inspection throughput times are further reduced, because scanning along a smooth blended path over larger surface areas eliminates discrete head stops altogether.
The intuitive yet powerful CMM-Manager metrology software benefits from a new set of icons guiding users flawlessly through the measurement process. The software also extends its application reach by introducing SP25 support on Metris CMMs and enhanced point cloud CAD handling. CMM-Manager is ideally suited to further improve metrology team efficiency because it serves as a single straightforward software tool supporting CMMs and articulated measuring arms of different brands.
Laser Radar showcases non-contact and non-target applications in large scale metrology, whereas iSpace invisibly measures, positions and tracks objects inside an entire work place. Manufacturing firms in aerospace, shipbuilding and many other industries standardize on Metris large-scale metrology to increase the quality and throughput in fabrication and assembly.
ABOUT METRIS
Metris designs, develops and markets a unique range of 3D hardware and software inspection systems servicing design and manufacturing industries. The company’s reliable and innovative metrology solutions cover the full range of measurement volumes required by automotive and aerospace customers, in both fixed and portable configurations and with optical and touch sensors. Further details are available at us.metris.com.
For further information please contact:
Metris Corporate:
Renaat Van Cauter, Director Corporate Marketing Communications
Tel +32 16 74 01 00 – Mobile +32...
Metris USA:
Peggy Long, Marketing Manager
Tel: (810) 220 4360 – Mobile: (248) 245 1944
E-mail: peggy.long@metris.com
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