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Fast-turnaround CMM laser scanning with Focus Scan 5.2

Leuven, March 30th, 2009 – Metris launches Focus Scan 5.2 software that firmly speeds up the preparation and execution of CMM laser scanning inspection jobs. Automatic scan path programming and virtual point cloud simulation allow users to quickly prepare – off-line or at the CMM – the complete acquisition, analysis and reporting workflow. In this way, Focus software further accelerates every step of the Digital Inspection Process, providing better insight and unparalleled productivity.

Automatic generation of scan programs

Besides laser scanners’ inherent advantage of requiring simpler motion paths, new automatic scan path programming in Focus Scan further reduces measurement preparation time. One click on the CAD surface area and a scan macro is automatically generated to define scanner path with optimum probe angles.

Scan path visualization helps metrology engineers to validate scan programming before going live. These visualizations include collision detection between scanner and part and a reliable estimation of CMM execution time, taking into account the actual scanner type.

Focus Scan Offline 5.2
Focus Scan automatically creates scan paths based on the CAD data

Set up analysis and reporting up-front

A breakthrough in validating scan macros is the new point spray feature that simulates a point cloud as if the part is measured on the CMM. The resulting virtual point cloud instantly reveals where part coverage is insufficient and additional scanning is needed. Additionally, point spray enables users to efficiently set up and automate the part program’s downstream analysis and reporting workflow. This typically occurs by defining point cloud processing actions such as filtering, meshing and feature extraction, before even switching on the CMM.

With Focus Scan 5.2, Metris once again added an important step in realizing its vision of a full Digital Inspection Process, which helps companies revolutionize their entire design-through-manufacturing process. The concept of digitizing samples and running inspection on the digital copies of the samples streamlines metrology operations and embeds them in the CAD-centric development process.




Learn more on Focus software suite

About Metris

Contact
Renaat Van Cauter – marketing@metris.com  – Tel +32 16 74 01 00 – Mob +32 486 64 24 33

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