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The imaging capabilities of Nikon Metrology instruments help advance academic and industrial material research. They revolutionize many research fields by opening up new applications that successfully respond to future technology challenges.

Natural specimens
Exterior and interior visualization of rocks, fossils, bones, meteorites and other natural samples enable provide ground-breaking insight into mineral sedimentary deposits and the evolution of animal anatomy. Micro-CT already allowed mineralogists, paleontologists, zoologists, ornithologists and entomologists to reveal remarkable aspects of present and past species that were unknown to date.

Related products: XT H 225, XT H 450,

CT image of soil sample


Rock and soil samples

Large rock and soil samples are examined through CT to trace voids, inclusions and disturbances. These findings are essential in investigating stability issues in the design and construction phases of large infrastructure, such as buildings, pipelines and offshore platforms.

Related products: XT H 225, XT H 450,


Innovative materials
Academic and industry researchers operate industrial X-ray and CT systems to advance research on carbon-fiber material, aluminum honeycomb structures and composite failure mechanisms. Their work with this enabling imaging equipment also focuses on the latest ceramic, plastic and composite structures – including tissue engineering and living composites.

Related products: XT H 225, XT H 450,  NeoScope


Metallurgical research
Metallic materials research digs deeper into the fundamentals of solidification and solid state phase transformations. X-ray and CT inspection help acquire information regarding microstructure formation, and improve the properties of commercial steel grades, super alloys or aluminum alloys. Also beneficial are video measuring systems and microscopes that are suitable for metal manufacturing, automotive manufacturing, metallurgy, grain sizing, cast iron nodularity and flake analysis.

Related products: XT H 225, XT H 450iNEXIV, NEXIV, Eclipse MA200, NIS-Elements, NeoScope

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