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News
19 Jul 2010

   Nikon Metrology and Verisurf team up to increase manufacturing efficiency

16 Jul 2010

   Nikon Confocal NEXIV VMZ-K6555 Provides New Measurement Possibilities for Demanding Applications

15 Jul 2010

   Nikon Metrology announces availability of Optelics H1200 real color confocal microscope

13 Jul 2010

   Nikon Metrology Enhances Observation Performance and Operation with Introduction of Eclipse L300N/L300ND

04 May 2010

   LC60Dx brings CMM laser scanning in the accuracy range of tactile measurement

04 May 2010

   ModelMaker MMDx facilitates handheld scanning

03 May 2010

   Nikon Metrology introduces ultimate handheld scanning solution featuring MCA II articulated arm

01 Apr 2010

   Nikon Metrology and Magestic Systems win 2010 JEC Automation Innovation Award

01 Apr 2010

   Nikon Forms Nikon Metrology, Inc. for Industrial-Based Metrology Customers

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XT V 160 irons out electronic flaws at Process Sciences Inc.


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ModelMaker scanners MMDx/MMCx


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Upcoming events

August 4-6, 2010
NACMA
Minneapolis, MN, USA

September13-18, 2010
IMTS 2010
Chicago, IL, USA

Sept 20, 2010
Studienamiddag CT scanning
Leuven, BE

Sept 22-23, 2010
CT conference London
London, UK

Sept 27-29, 2010
Zerstörungsfreie Werkstoffprüfung und 3D-Materialc
Wels, AU

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Latest news

19/07/2010
Nikon Metrology and Verisurf team up to increase manufacturing efficiency

16/07/2010
Nikon Confocal NEXIV VMZ-K6555 Provides New Measurement Possibilities for Demanding Applications

15/07/2010
Nikon Metrology announces availability of Optelics H1200 real color confocal microscope




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