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Metris became a member of the Nikon group
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Date: Feb 10-12
Booth: 4252
Location: Anaheim, CA, Anaheim Convention Center
Hosted By: Metris USA
Official Website: ATX West 2009
Visit Metris USA/X-Tek Booth# 4252
As the newest member of the Metris family of products, X-Tek offers the widest range of automated Computed Tomography and manual X-Ray Inspection Systems available. Metris invites you to experience the latest software and hardware advances on the Revolution X-Ray system, featuring sub-micron defect detection, 75-degree oblique viewing, digital detectors and automatic BGA analysis software. Metris also manufactures X-Ray Computed Tomography Systems for the highest resolution analysis, measurement, reverse engineering and product quality verification.
X-ray inspection of ball grid array CT scan of microchip
The XT V 160, also known as the Revolution, was developed utilizing X-Tek’s 20-plus years of experience in nano-focus X-ray technology. This system provides the highest resolution and magnification possible from a system of its type and is ideally suited for inspection of electronic components and printed circuit assemblies on production lines as well as failure analysis laboratories.
CT scan of turbine blade CT scan of lizard skull
Metris also manufactures X-Ray Computer Tomography Metrology Systems for fast internal analysis, measurement, reverse engineering and product verification. The XT H 225 is the industry leading real-time X-ray CT inspection system designed to deliver high quality results in a quick, straightforward process. With its powerful 225kV source and high resolution image processing, it is well suited for scans of a wide range of samples.
For more information on our x-ray product line, please visit our website.
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