The XT V 160R versatile X-ray system has been discontinued.
XT V 160R for semiconductor inspection
The XT V 160R is a versatile microfocus X-ray analysis system for both manual and programmed inspection of samples that demand the highest level of contrast sensitivity.
The XT 160 R fitted with a reflection target X-ray source has been developed in direct response to customer requirements and primarily aims at the semiconductor packaging applications for package void inspection.
- High contrast sensitivity
- Low energy imaging capability
- High resolution micron level features
- Advanced ergonomics
- Viewing from any angle
- Low cost of ownership
Categories: X-ray systems for electronics inspection