XT software suite for X-ray inspections of electronics

The XT Software Suite combines Inspect-X and CT-Pro into a single suite of programs to enhance the speed and functionality of the Nikon Metrology XT range of X-ray microscopes and CT systems. This software builds on Nikon Metrology’s track record of improving sample throughput and simplifying operation to take the systems out of the hands of experts and into the hands of users.

Key benefits

• Interactive visualization or fullyautomaticinspection
• High-resolution and high-magnification imaging reveals all defects
• Image analysis/ enhancement
• Component specific automated pass/fail analysis
• Automatic HTML report generation
• Integrated CT acquisition

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