Analogue probing offers high volume data collection plus high speed measurement   Analogue Probe scanning can be used in both unknown and programmed known path mode offering both high speed and high density data collection. Where feature form is a requirement, analogue scanning provides the ultimate data collection. Functionality and Compatibility: Simple programming for unknown path scanning using 3 points - start, direction and end point.

• Full support for known path scanning with native DMIS 4.0 commands PATH and PAMEAS using graphical based programming tools.
• Software filtering using Circular (UPR), Linear (Wavelength) and Point Elimination (Standard Deviation) algorithms.
• Automatic scan recovery continues measurement when contact is lost with the work-piece without any user intervention.
• Dynamic variable scan speed optimises the speed of data collection to suit the work-piece contour.
• Direct scanning of Lines, Planes, Circles, Cylinders, Cones, and Curve features.
• Direct data import into LK Digigraph Profile Reporting for graphical analysis.
• Scan data graphically compared direct to CAD model for surface analysis. (CAMIO Studio only)
• Scan speeds in excess of 10 m/min (166.66 mm/sec) and data collection rates of up to 100o points/second.
• Automatic probe compensation. . Reports displayed as tabular output.
• Outputs available to file, text and excel.

By using the best design practice in conjunction with modern design techniques (Computer Aided Design, FInite Element Analysis) the Evolution Range of CMM's has been finely tuned to allow the integration of Scanalog (Analogue Scanning) technology for everyday quality control inspection.