Overview
XT H 225/320 LC for X-ray and CT inspection of larger samples
The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.
With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span
Key benefits
- Proprietary 225/320kV microfocus X-ray source
- Run highly accurate inspection on dense industrial objects
- Easy system operation and low cost-of-ownership
- Stunning images providing great insight
- High performance image acquisition and volume processing
- Straightforward inspection automation
- Safety first
Categories: Computed Tomography
Applications: Cracks and Failure Analysis, Implants/Protheses, Streamlining vehicle pre-production, Composites, Rocks/Minerals, Metallurgy, Die and Mould Applications, Cosmetics, Manual examination, Critical assemblies of medical devices or drug delivery systems, Automated measurement, Damage propagation in composite material, Metal corrosion mechanisms, Unveiling mysteries of nature, Implant research, Metal Manufacturing, Plastic Manufacturing, Automotive Components Inspection, Aircraft Component Inspection, Household appliances and white goods , Dental applications, Mobile phones, shavers & watches
