K-Scan MMDx walkaround scanning | Handheld scanning | Laser Scanning | Products | Nikon Metrology

Nikon Metrology / Products / Laser Scanning / Handheld scanning / K-Scan MMDx walkaround scanning

K-Scan MMDx digital handheld laser scanner solutions

K-Series Optical CMM

Optical CMM are suited for effortless walkaround scanning, probe measurements of large objects, robotized metrology and dynamic measurements.

Increasing dynamic manufacturing quality, Assembly Plant Setup, 3rd Party Instrument Tracking, Full Vehicle Inspection, Aftermarkets

Request Info