Nov 10, 2011	Nikon ShuttlePix receives "iF design award 2012"
Sep 5, 2011	Necsa opens up South African research opportunities with microfocus Nikon Metrology X-ray and CT system
Jun 7, 2011	Geomagic and Nikon Metrology Partner to Offer Integrated Scanning Solution for 3D Reverse Engineering and Inspection
Apr 29, 2011	Nikon Metrology demonstrates complete laser scanner portfolio at Control 2011
Apr 28, 2011	CMM inspection is faster and easier with Nikon Metrology CAMIO7
Apr 12, 2011	HN-6060 True multi-sensor 3D metrology system sets new standards for non-contact inspection of complex shapes
Apr 12, 2011	iSpace for archeology turns your excavation area into a metrology lab
Feb 3, 2011	Nikon Metrology and Deva integrate Focus Scan with Deva CMM controller
Jan 26, 2011	CMM-Manager 3.0 features new Windows 7 style user interface
Jan 24, 2011	Nikon introduces new stereoscopic microscope SMZ745
Jan 12, 2011	Nikon Metrology incorporates Inspect-X and CT-Pro into XT software Suite v2.2
Nov 25, 2010	Nikon Metrology introduces ShuttlePix, a digital microscope with the ease-of-use and portability of a digital camera
Oct 14, 2010	Slashing inspection time with Laser Radar MV330/350
Sep 8, 2010	Rapidform to interface directly with Nikon Metrology handheld laser scanners
Sep 8, 2010	Nikon Instruments Announces Popular Vote for 2010 Nikon Small World Competition
Jul 16, 2010	Nikon Confocal NEXIV VMZ-K6555 Provides New Measurement Possibilities for Demanding Applications
Jul 13, 2010	Nikon Metrology enhances observation performance and operation with introduction of Eclipse L300N/L300ND
Apr 30, 2010	Nikon Instruments Announces 2010 Nikon Small World Judges
Apr 1, 2010	Nikon Forms Nikon Metrology, Inc. for Industrial-Based Metrology Customer
Mar 24, 2010	Nikon Small World Call For Entries Deadline April 30th
Jan 20, 2010	Nikon Instruments And The Wistar Institute Present Small World Exhibition And Microscopy Seminars
Oct 1, 2009	Nikon Introduces Software Upgrade for iNexiv Multi-Sensor Measuring System
Oct 1, 2009	Nikon Introduces BW-H501 High-Speed, High-Precision 3D Surface Profile System
Sep 22, 2009	Nikon Instruments Welcomes Metris to the Nikon Corporate Family
Aug 20, 2009	New Inspection Microscope Offers Improved Observation and Imaging
Aug 12, 2009	Nikon Instruments' New SMZ-745T Line of Stereo Microscopes Offers Highest Zoom Magnification in its Class
Aug 5, 2009	Nikon Instruments Opens Online Game With Winning Small World Images
Aug 1, 2009	Nikon Instruments' New MM-200 Measuring Microscope Combines Precision and Accuracy in Compact, Space-Saving Body
Apr 28, 2009	Nikon Instruments Announces Judges for Nikon Small World
Mar 31, 2009	Nikon Small World Entry Deadline is April 30th
Oct 16, 2008	Marine Diatoms Capture Top Honors at Nikon Small World 2008
Oct 16, 2008	Chick Embryo Wins Popular Vote in Nikon Small World Competition
Sep 18, 2008	Nikon Instruments Opens Popular Vote for This Year's Nikon Small World Competition
Sep 16, 2008	Nikon Instruments Launches Online Game With Winning Small World Images
Sep 10, 2008	Nikon Introduces Inverted Materials Microscope, Eclipse MA200
Sep 8, 2008	New Digital CAD Overlay Brings Easy Visualization to Nikon's iNexiv VMA Automeasure Software
Jul 15, 2008	Nikon Instruments Introduces New Microscopes and Illumination Stand for Education and OEM Markets
Jul 15, 2008	Nikon's New Wafer Loader NWL200 Series Is the First Ever Capable of Loading Wafers as Thin as 100 Micrometers
Jul 15, 2008	Nikon Instruments Introduces LV-DAF for Full System Integration with Eclipse LV Microscope Series
Jul 15, 2008	Nikon's New WES-3000 Wafer Edge Inspection Tool Offers High-Throughput, In-Line Inspection With High-Resolution
Jul 15, 2008	Nikon's New APM-3000 Series Fills Gap Between CD SEM and OCD Semiconductor Inspection Devices
May 27, 2008	Nikon Instruments Receives Record Number of Entries for Nikon Small World
Mar 27, 2008	Nikon Small World Entry Deadline Is April 30th
Oct 5, 2007	Mouse Embryo Captures Top Honors At Nikon Small World
Oct 5, 2007	Crystallized Solgel Chemical Takes Top Prize in the Nikon Small World Popular Vote
Sep 28, 2007	Nikon's iNEXIV Multi-Sensor Measuring System Now Offers Touch Probe Technology
Aug 7, 2007	Nikon Announces New Versatile, Universal Design Microscope
Jul 10, 2007	Nikon Instruments Opens Judging Of This Year's Nikon Small World Competition To The Public For The First Time
Jan 16, 2007	Nikon's New iNEXIV Multi-Sensor Measuring System Offers 3D Image Documentation
Oct 30, 2006	Nikon's New Eclipse MA100 Inverted Metallurgical Microscope Delivers Rapid Production Inspection Capability
Oct 13, 2006	Nikon Enhances Its LiveScan Swept Field Confocal Microscope
Oct 13, 2006	Nikon Introduces the AZ100 Multizoom Microscope
Oct 13, 2006	Nikon's New NIS-Elements V2.3 Speeds Image Acquisition and Enhances Analysis Capability
Sep 25, 2006	Nikon Announces NIS-Elements Documentation Software
Sep 25, 2006	Nikon Revamps E-MAX Software
Sep 25, 2006	Nikon Expands its 'Digital Sight' Line of Advanced Digital Camera Imaging Systems
Sep 25, 2006	Nikon Seamlessly Integrates Digital Imaging With Industrial Metrology
Sep 12, 2006	Nikon's Small World Winning Images Exhibit at the National Academy of Sciences
May 16, 2006	Nikon Announces NIS-Elements Documentation Software
May 2, 2006	Nikon Instruments Unveils Judges for 32nd International Small World Competition
Nov 7, 2005	Nikon's New NIS-Elements Software Delivers Scalable Functionality - Setting New Industry Benchmarks
Oct 18, 2005	Nikon's Small World Calendar Showcasing Amazing Photomicrographs Is Now Available
Oct 6, 2005	Common Housefly Soars to First Place at Nikon's Small World
Jul 20, 2005	Nikon Instruments Announces Judges for 31st International Small World Competition
Jul 12, 2005	Nikon's Confocal NEXIV Delivers a New Dimension in IC Metrology
Jun 20, 2005	Nikon Expands Its Eclipse Line Of Industrial Microscope Imaging Solutions
Apr 18, 2005	Nikon Introduces NEXIV VMR LU Series Measuring System
Apr 18, 2005	Nikon Expands its 'Digital Sight' Line of Advanced Digital Camera Imaging Systems
Jan 24, 2005	Nikon Integrates Industrial Microscopy and Metrology Organizations
Oct 11, 2004	Nikon Instruments Announces Record Sales of Its NRM-3100 Overlay Inspection Measurement System
Oct 6, 2004	Nanotechnology Makes a Small World Even Smaller
Sep 16, 2002	Nikon Instruments, Inc. Creates New Business Divisions
Jun 27, 2002	Nikon Names Hiro Kusaka as President & CEO of Nikon Instruments, Inc.
Jan 30, 2002	Nikon IC Inspection Microscopes Attachment Offers Outstanding Optics and Real Time Confocal Imaging
Jul 18, 2001	Optistation-3000 Series Offers High-Precision, Ultra-Fast Inspection For 300MM Wafers
Apr 24, 2001	Nikon NEXIV VM-1000 3D Video Measuring Instrument Allows Measurement of More Parts Without Loading or Unloading
Apr 24, 2001	Nikon NEXIV VMH-300 Video Measuring Instrument Provides High Speed, High Accuracy, 3D Metrology
Apr 24, 2001	Nikon Introduces Improved Video Measuring Instruments with Increased Speed, Accuracy and Illumination
Apr 16, 2001	Nikon Introduces Eclipse ME600L Industrial Microscope Offering Flexible Illumination Options
Apr 9, 2001	Nikon Introduces Eclipse L150 and 150A Industrial Microscope For Materials Science Applications
Mar 30, 2001	New Study Finds That Use of Ergonomic Microscopes Can Reduce Risk of Workplace Injury, Benefiting Users
Jul 28, 2000	Nikon Introduces SMZ1500 Stereo Microscope with Highest Optical Performance, Largest Zoom Range Available
Jul 10, 2000	Nikon Introduces Video Measuring Instruments With High Speed, High Accuracy, High Intelligence
May 18, 2000	Nikon Sells 300mm Semiconductor Inspection Stations