Nikon Metrology News

New Case Story: High resolution CT scanning to shed new light on human evolution

April 15, 2014

The University of the Witwatersrand in Johannesburg is using a Nikon Metrology micro-CT scanner in its Palaeosciences Centre...

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New Case Story: High accuracy horizontal arm CMM inspects next-generation automotive fixtures

April 3, 2014

 Materialise Group spin-off, RapidFit, has deployed a horizontal-arm co-ordinate measuring machine (CMM) from Nikon Metrology to check the accuracy of bespoke gauging and holding fixtures it produces for the automotive industry....

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New Case Story: X-Ray Computed Tomography expands horizons of anthropology at Duke university

March 21, 2014

At Duke University (Durham, NC), the school’s X-ray micro Computed Tomography equipment spans a growing number of disciplines and users. One of the main researches is related to anthropology studying the origin of mankind. But also biotech firms, electronic materials companies, government research organizations, and many...

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New iNEXIV VMA-4540 video measuring systems for precise inspection of larger samples

March 10, 2014

Nikon Metrology is pleased to announce two new CNC video measuring systems, the iNEXIV VMA-4540V and 4540. These products offer a wide field of view, easy operation, and allow the measurement of both large and tall mechanical parts. The new iNEXIV VMA-4540 CNC Video Measuring Systems will be presented at the CONTROL 2014...

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New case story: In-process X-ray inspection improves quality control of circuit boards - and cut costs

January 21, 2014

Nikon Metrology equipment will pay for itself in less than two years Swiss-owned electronic and mechatronic systemsman...

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University of Leuven applies metrology CT to research geometrical accuracy of inner and outer features of industrial components

November 29, 2013

Many components and assemblies have internal features that are difficult to inspect nondestructively, as conventional metrology requires them to be sectioned. Examples are a hollow hydroformed camshaft, a 3D printed mould with conformal cooling channels, or a plastic injection moulded electrical connector with metal...

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New case story: Scanning electron microscope for world-class facility developing next-generation ceramics

November 11, 2013

Nikon Metrology SEM supports pioneering ceramics applications, from cancer treatment to pump technology A JCM-6000 Neo...

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Nikon introduces the “NEXIV VMZ-R3020” and “NEXIV VMZ-R6555”

September 25, 2013

Nikon Corporation (Makoto Kimura, President, Tokyo) is pleased to announce the release of CNC Video Measuring Systems “NEXIV VMZ-R3020” and “NEXIV VMZ-R6555,” capable of accurately measuring the dimensions and shapes of high-density and multi-layered electronic components.Product information Product Name: CNC Video Measu...

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CAMIO8 multi-sensor CMM software provides better insights and more productivity

September 10, 2013

CAMIO offers true multi-sensor capability, allowing best-practice selection of sensor technology for each task. By combining touch trigger, analog scanning and 3D laser scanning sensors within the same inspection program,  the right inspection results are obtained in the fastest way. Nikon Metrology multi-sensor sol...

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New case story: Laser scanning opens new business opportunities at diecasting company

July 15, 2013

At PMS Diecasting in Rotherham, UK, products are inspected by non-contact, 3D laser scanning to an accuracy of 2.5 microns, mirroring the precision of touch probing. It has been made possible by the deployment of an LC15Dx laser scanner on an LK ceramic bridge co-ordinate measuring machine supplied by Nikon Metrology. Th...

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Jun 13, 2013 New case story: Automated nikon photo-microscope supports world-leading rock analysis
May 13, 2013 Nikon Metrology announces high accuracy metrology CT system
May 13, 2013 Nikon Metrology introduces new ALTERA range of CMMs
May 13, 2013 Nikon introduces new Research Stereo Microscopes SMZ25/SMZ18
Jan 24, 2013 Nikon Metrology's Laser Radar integrates with Metrologic Group's Metrolog X4, advancing the technology to new heights
Dec 6, 2012 InnovMetric Software announces that it has developed a free plug-in for the Nikon Metrology Laser Radar MV224 and MV330/350 devices
Sep 10, 2012 Nikon Metrology introduces premium portable scanning solution featuring new MCAx articulated arm and ModelMaker MMDx/MMCx scanners
Jul 10, 2012 New JCM-6000 NeoScope II with higher magnification and multi-touch screen control, and a sleek new design
Feb 29, 2012 Nikon LC15Dx scanner closes the gap with tactile probe accuracy
Dec 15, 2011 Nikon Metrology Focus 10 brings CMM and handheld scanning experience to a higher level
Nov 22, 2011 New X-ray research centre at Southampton University equipped with Nikon Metrology Systems
Nov 10, 2011 Nikon ShuttlePix receives "iF design award 2012"
Sep 5, 2011 Necsa opens up South African research opportunities with microfocus Nikon Metrology X-ray and CT system
Jun 7, 2011 Geomagic and Nikon Metrology Partner to Offer Integrated Scanning Solution for 3D Reverse Engineering and Inspection
Apr 29, 2011 Nikon Metrology demonstrates complete laser scanner portfolio at Control 2011
Apr 28, 2011 CMM inspection is faster and easier with Nikon Metrology CAMIO7
Apr 12, 2011 HN-6060 True multi-sensor 3D metrology system sets new standards for non-contact inspection of complex shapes
Apr 12, 2011 iSpace for archeology turns your excavation area into a metrology lab
Feb 3, 2011 Nikon Metrology and Deva integrate Focus Scan with Deva CMM controller
Jan 26, 2011 CMM-Manager 3.0 features new Windows 7 style user interface
Jan 24, 2011 Nikon introduces new stereoscopic microscope SMZ745
Jan 12, 2011 Nikon Metrology incorporates Inspect-X and CT-Pro into XT software Suite v2.2
Nov 25, 2010 Nikon Metrology introduces ShuttlePix, a digital microscope with the ease-of-use and portability of a digital camera
Oct 14, 2010 Slashing inspection time with Laser Radar MV330/350
Sep 8, 2010 Rapidform to interface directly with Nikon Metrology handheld laser scanners
Sep 8, 2010 Nikon Instruments Announces Popular Vote for 2010 Nikon Small World Competition
Jul 16, 2010 Nikon Confocal NEXIV VMZ-K6555 Provides New Measurement Possibilities for Demanding Applications
Jul 13, 2010 Nikon Metrology enhances observation performance and operation with introduction of Eclipse L300N/L300ND
Apr 30, 2010 Nikon Instruments Announces 2010 Nikon Small World Judges
Apr 1, 2010 Nikon Forms Nikon Metrology, Inc. for Industrial-Based Metrology Customer
Mar 24, 2010 Nikon Small World Call For Entries Deadline April 30th
Jan 20, 2010 Nikon Instruments And The Wistar Institute Present Small World Exhibition And Microscopy Seminars
Oct 1, 2009 Nikon Introduces Software Upgrade for iNexiv Multi-Sensor Measuring System
Oct 1, 2009 Nikon Introduces BW-H501 High-Speed, High-Precision 3D Surface Profile System
Sep 22, 2009 Nikon Instruments Welcomes Metris to the Nikon Corporate Family
Aug 20, 2009 New Inspection Microscope Offers Improved Observation and Imaging
Aug 12, 2009 Nikon Instruments' New SMZ-745T Line of Stereo Microscopes Offers Highest Zoom Magnification in its Class
Aug 5, 2009 Nikon Instruments Opens Online Game With Winning Small World Images
Aug 1, 2009 Nikon Instruments' New MM-200 Measuring Microscope Combines Precision and Accuracy in Compact, Space-Saving Body
Apr 28, 2009 Nikon Instruments Announces Judges for Nikon Small World
Mar 31, 2009 Nikon Small World Entry Deadline is April 30th
Oct 16, 2008 Marine Diatoms Capture Top Honors at Nikon Small World 2008
Sep 10, 2008 Nikon Introduces Inverted Materials Microscope, Eclipse MA200
Sep 8, 2008 New Digital CAD Overlay Brings Easy Visualization to Nikon's iNexiv VMA Automeasure Software
Jul 15, 2008 Nikon Instruments Introduces New Microscopes and Illumination Stand for Education and OEM Markets
Jul 15, 2008 Nikon's New Wafer Loader NWL200 Series Is the First Ever Capable of Loading Wafers as Thin as 100 Micrometers
Jul 15, 2008 Nikon Instruments Introduces LV-DAF for Full System Integration with Eclipse LV Microscope Series
Jul 15, 2008 Nikon's New WES-3000 Wafer Edge Inspection Tool Offers High-Throughput, In-Line Inspection With High-Resolution
Jul 15, 2008 Nikon's New APM-3000 Series Fills Gap Between CD SEM and OCD Semiconductor Inspection Devices
May 27, 2008 Nikon Instruments Receives Record Number of Entries for Nikon Small World
Mar 27, 2008 Nikon Small World Entry Deadline Is April 30th
Oct 5, 2007 Mouse Embryo Captures Top Honors At Nikon Small World
Oct 5, 2007 Crystallized Solgel Chemical Takes Top Prize in the Nikon Small World Popular Vote
Sep 28, 2007 Nikon's iNEXIV Multi-Sensor Measuring System Now Offers Touch Probe Technology
Aug 7, 2007 Nikon Announces New Versatile, Universal Design Microscope
Jul 10, 2007 Nikon Instruments Opens Judging Of This Year's Nikon Small World Competition To The Public For The First Time
Jan 16, 2007 Nikon's New iNEXIV Multi-Sensor Measuring System Offers 3D Image Documentation
Oct 30, 2006 Nikon's New Eclipse MA100 Inverted Metallurgical Microscope Delivers Rapid Production Inspection Capability
Oct 13, 2006 Nikon Enhances Its LiveScan Swept Field Confocal Microscope
Oct 13, 2006 Nikon Introduces the AZ100 Multizoom Microscope
Oct 13, 2006 Nikon's New NIS-Elements V2.3 Speeds Image Acquisition and Enhances Analysis Capability
Sep 25, 2006 Nikon Announces NIS-Elements Documentation Software
Sep 25, 2006 Nikon Revamps E-MAX Software
Sep 25, 2006 Nikon Expands its 'Digital Sight' Line of Advanced Digital Camera Imaging Systems
Sep 25, 2006 Nikon Seamlessly Integrates Digital Imaging With Industrial Metrology
Sep 12, 2006 Nikon's Small World Winning Images Exhibit at the National Academy of Sciences
May 16, 2006 Nikon Announces NIS-Elements Documentation Software
May 2, 2006 Nikon Instruments Unveils Judges for 32nd International Small World Competition
Nov 7, 2005 Nikon's New NIS-Elements Software Delivers Scalable Functionality - Setting New Industry Benchmarks
Oct 18, 2005 Nikon's Small World Calendar Showcasing Amazing Photomicrographs Is Now Available
Oct 6, 2005 Common Housefly Soars to First Place at Nikon's Small World
Jul 20, 2005 Nikon Instruments Announces Judges for 31st International Small World Competition
Jul 12, 2005 Nikon's Confocal NEXIV Delivers a New Dimension in IC Metrology
Jun 20, 2005 Nikon Expands Its Eclipse Line Of Industrial Microscope Imaging Solutions
Apr 18, 2005 Nikon Introduces NEXIV VMR LU Series Measuring System
Apr 18, 2005 Nikon Expands its 'Digital Sight' Line of Advanced Digital Camera Imaging Systems
Jan 24, 2005 Nikon Integrates Industrial Microscopy and Metrology Organizations
Oct 11, 2004 Nikon Instruments Announces Record Sales of Its NRM-3100 Overlay Inspection Measurement System
Oct 6, 2004 Nanotechnology Makes a Small World Even Smaller
Sep 16, 2002 Nikon Instruments, Inc. Creates New Business Divisions
Jun 27, 2002 Nikon Names Hiro Kusaka as President & CEO of Nikon Instruments, Inc.
Jan 30, 2002 Nikon IC Inspection Microscopes Attachment Offers Outstanding Optics and Real Time Confocal Imaging
Jul 18, 2001 Optistation-3000 Series Offers High-Precision, Ultra-Fast Inspection For 300MM Wafers
Apr 24, 2001 Nikon NEXIV VM-1000 3D Video Measuring Instrument Allows Measurement of More Parts Without Loading or Unloading
Apr 24, 2001 Nikon NEXIV VMH-300 Video Measuring Instrument Provides High Speed, High Accuracy, 3D Metrology
Apr 24, 2001 Nikon Introduces Improved Video Measuring Instruments with Increased Speed, Accuracy and Illumination
Apr 16, 2001 Nikon Introduces Eclipse ME600L Industrial Microscope Offering Flexible Illumination Options
Apr 9, 2001 Nikon Introduces Eclipse L150 and 150A Industrial Microscope For Materials Science Applications
Mar 30, 2001 New Study Finds That Use of Ergonomic Microscopes Can Reduce Risk of Workplace Injury, Benefiting Users
Jul 28, 2000 Nikon Introduces SMZ1500 Stereo Microscope with Highest Optical Performance, Largest Zoom Range Available
Jul 10, 2000 Nikon Introduces Video Measuring Instruments With High Speed, High Accuracy, High Intelligence
May 18, 2000 Nikon Sells 300mm Semiconductor Inspection Stations

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