Telecom & Electronics
Telecom systems typically contain electronics subsystems. For mission-critical space applications, system failure is not an option. Also in other markets, telecom systems are checked inside-out through X-ray and computer tomography (CT) inspection.
By visualizing connectivity failures in electronic devices and circuit boards, or between both, the XT V160 electronics inspection system provides detailed insight into what really causes the problem. The ability to literally look inside electronic parts and systems is essential in optimizing electronics design and manufacturing practices.
On the electronics production floor, most inspection work is related to electronic connectivity issues including wire bonds, solder joints and through-layer vias. The XT V 130 inspection system is also capable of tracing more challenging defects. Angled imaging with high magnification quickly highlights shorts in the form of solder dendrites and voids scattered around ball grid array (BGA) connections.
Other metrology systems can be used to inspect features and surfaces of electronic components and assemblies that are visible from the outside. iNEXIV and NEXIV are automated video measuring systems that offer the speed and accuracy to quickly run inspection on electronic cards, devices and connectors.
Smaller individual parts can also be measured using industrial or measuring microcopes.
Associated Products
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XT V 130 Electronics X-ray system
Compact XT V 130 QA-system for affordable X-ray visualization and automated inspection
X-ray inspection of BGA, wirebonds, MEMS, loaded PCB, MEMS, Microelectronics, Optoelectronics, Telecom & Electronics…
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XT V 160R versatile X-ray system
The XT V 160R is a versatile microfocus X-ray system for both manual and programmed inspection of electronics, semiconductor or small industrial samples.
X-ray inspection of BGA, wirebonds, MEMS, loaded PCB, Telecom & Electronics, Automated measurement, Mobile phones, shavers & watches
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iNEXIV VMA-2520
High-speed, high accuracy benchtop digital metrology and imaging system.
Cracks and Failure Analysis, Surface Examination, Telescope optics, Antennae, Surface Analysis…
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NEXIV VMR-1515
Affordable, small-size benchtop system (150x150mmx150mm stage).
Cracks and Failure Analysis, Implants/Protheses, Surface Examination, Telescope optics, Surface Analysis…
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NEXIV VMR-3020
The standard model of the NEXIV series (300x200mm stage).
Implants/Protheses, Surface Examination, Liquid Crystal Displays, Telescope optics, Antennae…
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NEXIV VMR-H3030
Ultra-high precision model achieves sub-micrometer level uncertainty (300x300x150mm stage).
Surface Examination, Telescope optics, Antennae, Surface Analysis, Powertrain Components…
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NEXIV VMR-6555
Mid-sized stage model engineered for high speed measurements (650x550mm stage).
Cracks and Failure Analysis, Implants/Protheses, Surface Examination, Liquid Crystal Displays, Telescope optics…
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NEXIV VMR-10080
1000x800mm stage stroke model geared for large-size workpieces.
Liquid Crystal Displays, Telescope optics, Antennae, Surface Analysis, Powertrain Components…
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NEXIV VMR-12072
47-inch display device measurement platform with ultra-long 1200x720mm stage.
Telescope optics, Antennae, Powertrain Components, Telecom & Electronics, Automated measurement…
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NEXIV VMR-K3040ZC
Ideal for measuring micro-dimensional 2D and 3D workpieces such as FPD devices.
Liquid Crystal Displays, Telescope optics, Antennae, MEMS, Powertrain Components…
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AZ100 Multizoom
A new zoom microscope solution for macro imaging applications for biomedical and industrial markets.
Implants/Protheses, Telescope optics, Antennae, Composites, Cracks and Failure Analysis…
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Eclipse 50i POL
Compact polarizing microscope that balances optical performance and ease of use.
Telescope optics, Antennae, Composites, Asbestos, Fabrics/Textiles…
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Eclipse L200N Series
200mm wafer and mask inspection microscope systems for reflected light defect identification.
Wafers, Telescope optics, Antennae, Telecom & Electronics, Mobile phones, shavers & watches
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Eclipse LV100D
Transmitted and reflected light microscope system for materials sciences, semiconductor and Bio-material applications.
Cracks and Failure Analysis, Implants/Protheses, Telescope optics, Antennae, Composites…
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Eclipse L300 Series
300mm wafer and mask inspection microscope systems for reflected light defect identification.
Wafers, Liquid Crystal Displays, Telescope optics, Antennae, Telecom & Electronics…
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Eclipse LV100 POL
Quantitative polarizing light microscopes for research applications.
Telescope optics, Antennae, Composites, Asbestos, Fabrics/Textiles…
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Eclipse LV150 Series
Modular reflected light microscope systems for wafer inspection and materials science applications.
Implants/Protheses, Surface Examination, Wafers, Liquid Crystal Displays, Telescope optics…
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Eclipse LV150L
A new industrial microscope designed especially for episcopic illumination applications.
Telescope optics, Antennae, Telecom & Electronics, Mobile phones, shavers & watches
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Eclipse LV-DAF
An upright microscope with dynamic auto-focus that brings fast, versatile focus to the Eclipse LV semiconductor inspection microscope series and OEM applications.
Telescope optics, Antennae, Telecom & Electronics, Mobile phones, shavers & watches
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Eclipse LV-UDM Series
Universal microscope providing optical technology for industrial, biological and crossover use.
Telescope optics, Antennae, Telecom & Electronics, Mobile phones, shavers & watches
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Eclipse L300N Series
300mm wafer and mask inspection microscope systems for reflected light defect identification.
Telescope optics, Antennae, Telecom & Electronics, Mobile phones, shavers & watches
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Eclipse E200 POL
A cost-efficient polarizing microscope incorporating industry-acclaimed CFI60 optics.
Telescope optics, Antennae, Asbestos, Telecom & Electronics, Plastic Manufacturing…
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Eclipse MA100
A compact inverted metallurgical microscope designed for routine observation and analysis.
Surface Examination, Cast iron nodularity and flake analysis, Telescope optics, Antennae, Metallurgy…
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Eclipse MA200
A new inverted metallurgical microscope optimized for digital imaging and ergonomic efficiency.
Surface Examination, Cast iron nodularity and flake analysis, Telescope optics, Antennae, Metallurgy…
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SMZ1000
Stereomicroscope with a 10:1 zoom ratio, superb optical performance and advanced ergonomics.
Cracks and Failure Analysis, Implants/Protheses, Surface Examination, Telescope optics, Antennae…
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SMZ1500
A stereomicroscope optical powerhouse, with a 15:1 zoom ratio and high N.A.’s producing high-contrast, tack-sharp images.
Implants/Protheses, Surface Examination, Telescope optics, Antennae, Composites…
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SMZ445-460
Compact, lightweight and cost effective microscopes featuring all-new Porro prism optics.
Implants/Protheses, Telescope optics, Antennae, Telecom & Electronics, Manual examination…
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SMZ645-660
Affordable workhorse stereomicroscope with 6:3 zoom ratio and 4x to 300x magnification range.
Implants/Protheses, Surface Examination, Telescope optics, Antennae, Composites…
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SMZ745/745T
Trinocular stereoscopic microscope ideally suited for observation and digital imaging. Features an impressive 7.5x zoom range.
Implants/Protheses, Surface Examination, Telescope optics, Antennae, MEMS…
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SMZ800
Stereomicroscope featuring a 6.3:1 zoom ratio, ergonomic design, and impressive expansion options.
Implants/Protheses, Surface Examination, Telescope optics, Antennae, Composites…
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MM400/800 Toolmakers Microscopes
High precision measuring microscopes featuring the latest in digital imaging technology.
Cracks and Failure Analysis, Implants/Protheses, Telescope optics, Antennae, Surface Analysis…
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MM-200 Toolmakers Microscope
Compact and affordable measuring microscope system featuring exceptional quality, accuracy and durability.
Implants/Protheses, Surface Examination, Telescope optics, Antennae, Surface Analysis…
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XT V 160 Electronics X-ray system
The XT V 160 is specifically designed for x-ray inspection in production lines and failure analysis laboratories.
X-ray inspection of BGA, wirebonds, MEMS, loaded PCB, MEMS, Microelectronics, Optoelectronics, Telecom & Electronics…
